The Fourier integral transform is used to reduce the diffraction problem of the normal SH-wave on a semi-infinite rigid inclusion in elastic layer to the Wiener–Hopf equation. Its solution is obtained by the factorization method. The analytical expressions of the diffracted displacement fields are represented in any region of interest. The dependences of the scattered field on the parameters of the structure are given. The properties of identification of the inclusion type defect in the plane layer are illustrated.

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